Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

被引：20

作者：

Durkan, C ^{[1
]}

Shvets, IV ^{[1
]}

机构：

[1] Univ Dublin Trinity Coll, Dept Phys, Dublin 2, Ireland

来源：

JOURNAL OF APPLIED PHYSICS | 1998年 / 83卷 / 03期

关键词：

D O I：

10.1063/1.366812

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A reflection-mode aperture-type scanning near-field optical microscope (R-SNOM) based on the external collection of the reflected light is presented. The light detection is based on an elliptical mirror setup, with the tip and sample at one focus, and a photomultiplier tube at the other. Results are presented on the general imaging properties of this microscope. The results presented concentrate on an analysis of the gap-width dependence of the optical signal, on resolution and on the contrast mechanisms which may be used in R-SNOM imaging, including reflectivity, polarization/magneto-optics, and topographic effects. (C) 1998 American Institute of Physics. [S0021-8979(98)09503-6].

引用

页码：1171 / 1176

页数：6

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