Low coverages of lithium on Si(001) studied with STM and ARUPS

被引:24
作者
Johansson, MKJ
Gray, SM
Johansson, LSO
机构
[1] Department of Synchrotron Radiation Research, Institute of Physics, Lund University, S-223 62 Lund
来源
PHYSICAL REVIEW B | 1996年 / 53卷 / 03期
关键词
D O I
10.1103/PhysRevB.53.1362
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have used scanning tunneling microscopy (STM), scanning tunneling spectroscopy, and synchrotron based angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) to study the initial stages of the adsorption of lithium onto the Si(001)-2x1 surface. Our STM study shows that the half-missing dimer defects (C defects) act as sites for Li adsorption on this surface. Once these are occupied the Li adsorbs on top of the dimer atoms and forms small clusters, which stabilize the dimer buckling seen by the STM into areas of c(4x2) symmetry. This is observed with ARUPS as a peak at the Fermi level, originating from partial occupation of an empty surface band associated with the c(4x2) reconstruction. On p-type Si substrates, STM shows that small amounts of Li cause further dramatic changes to the electronic structure of the surface. We observe negative differential conductance (NDC) on both Li sites and clean Si dimers, as well as digital switching in the tunnel current over the Li sites. We propose that this trapping noise is caused by electrons emptying and filling thermally activated traps close to the Fermi level and that the NDC has its origin in coulombic repulsion by occupied traps on the surface.
引用
收藏
页码:1362 / 1367
页数:6
相关论文
共 34 条
[1]  
BATRA IP, 1989, NATO ADV STUDY I B, V195
[2]   DEMONSTRATION OF THE TUNNEL-DIODE EFFECT ON AN ATOMIC SCALE [J].
BEDROSSIAN, P ;
CHEN, DM ;
MORTENSEN, K ;
GOLOVCHENKO, JA .
NATURE, 1989, 342 (6247) :258-260
[3]   SUBMONOLAYER-COVERAGE AND MONOLAYER-COVERAGE STRUCTURES OF K/SI(100) [J].
BRODDE, A ;
BERTRAMS, T ;
NEDDERMEYER, H .
PHYSICAL REVIEW B, 1993, 47 (08) :4508-4516
[4]   SCANNING TUNNELING MICROSCOPY OF PHOTOEXCITED CARRIERS AT THE SI(001) SURFACE [J].
CAHILL, DG ;
HAMERS, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :564-567
[5]   ADSORPTION OF K ON SI(100)2X1 AT ROOM-TEMPERATURE STUDIED WITH PHOTOELECTRON-SPECTROSCOPY [J].
CHAO, YC ;
JOHANSSON, LSO ;
KARLSSON, CJ ;
LANDEMARK, E ;
UHRBERG, RIG .
PHYSICAL REVIEW B, 1995, 52 (04) :2579-2586
[6]   INFLUENCE OF DOPING ON THE BULK DIFFUSION OF LI INTO SI(100) [J].
ECKHARDT, M ;
KLEINE, H ;
FICK, D .
SURFACE SCIENCE, 1994, 319 (1-2) :219-223
[7]   ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(001)2X1-K SURFACE [J].
ENTA, Y ;
KINOSHITA, T ;
SUZUKI, S ;
KONO, S .
PHYSICAL REVIEW B, 1987, 36 (18) :9801-9804
[8]   ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON SPECTROSCOPIC STUDY OF SI(001)-(2X1)/K AND SI(001)-(2X1)/CS SURFACES [J].
ENTA, Y ;
KINOSHITA, T ;
SUZUKI, S ;
KONO, S .
PHYSICAL REVIEW B, 1989, 39 (02) :1125-1133
[9]  
GREHK TM, IN PRESS PHYS REV B
[10]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357