Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates:: An EXAFS study

被引:41
作者
Brunet, F [1 ]
Mélinon, P
San Miguel, A
Kéghélian, P
Perez, A
Flank, AM
Reny, E
Cros, C
Pouchard, M
机构
[1] Univ Lyon 1, Dept Phys Mat, F-69622 Villeurbanne, France
[2] Ctr Univ Paris Sud, LURE, F-91898 Orsay, France
[3] Univ Bordeaux 1, Inst Chim Mat Condensee, F-33608 Pessac, France
关键词
D O I
10.1103/PhysRevB.61.16550
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of doping silicon clathrate structures with sodium atoms has been investigated experimentally by x-ray photoemission and x-ray absorption spectroscopies. Both techniques reveal a poor screening of the sodium atoms inside the silicon cages. We also discuss the sodium state that is intermediate between the metal-like and the atomlike ones. These results are in agreement with theoretical predictions of Demkov et al. and Smelyansky and Tse. In addition, the fine analysis of the extended x-ray absorption fine structure region reveals unambiguously a large displacement (0.9 +/- 0.2 Angstrom) of the sodium atom with respect to the center of the silicon cage. This displacement is higher than the one predicted by a simple Jahn-Teller effect and is discussed in terms of sodium pairing. The formation of dimers with covalent bonding is compared to the Peierls distortion in a monodimensional network.
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页码:16550 / 16560
页数:11
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