Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates:: An EXAFS study

被引:42
作者
Brunet, F [1 ]
Mélinon, P
San Miguel, A
Kéghélian, P
Perez, A
Flank, AM
Reny, E
Cros, C
Pouchard, M
机构
[1] Univ Lyon 1, Dept Phys Mat, F-69622 Villeurbanne, France
[2] Ctr Univ Paris Sud, LURE, F-91898 Orsay, France
[3] Univ Bordeaux 1, Inst Chim Mat Condensee, F-33608 Pessac, France
关键词
D O I
10.1103/PhysRevB.61.16550
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of doping silicon clathrate structures with sodium atoms has been investigated experimentally by x-ray photoemission and x-ray absorption spectroscopies. Both techniques reveal a poor screening of the sodium atoms inside the silicon cages. We also discuss the sodium state that is intermediate between the metal-like and the atomlike ones. These results are in agreement with theoretical predictions of Demkov et al. and Smelyansky and Tse. In addition, the fine analysis of the extended x-ray absorption fine structure region reveals unambiguously a large displacement (0.9 +/- 0.2 Angstrom) of the sodium atom with respect to the center of the silicon cage. This displacement is higher than the one predicted by a simple Jahn-Teller effect and is discussed in terms of sodium pairing. The formation of dimers with covalent bonding is compared to the Peierls distortion in a monodimensional network.
引用
收藏
页码:16550 / 16560
页数:11
相关论文
共 55 条
[51]   The electronic structure of metallo-silicon clathrates NaxSi136 (x=0, 4, 8, 16 and 24) [J].
Smelyansky, VI ;
Tse, JS .
CHEMICAL PHYSICS LETTERS, 1997, 264 (05) :459-465
[52]   THEORETICAL DETERMINATION OF THE PRESSURE-DEPENDENCE OF THE ELECTRONIC AND THE OPTICAL-PROPERTIES OF FCC C-60 [J].
XU, YN ;
HUANG, MZ ;
CHING, WY .
PHYSICAL REVIEW B, 1992, 46 (07) :4241-4245
[53]   PREPARATION OF BARIUM-CONTAINING SILICON CLATHRATE COMPOUND [J].
YAMANAKA, S ;
HORIE, H ;
NAKANO, H ;
ISHIKAWA, M .
FULLERENE SCIENCE AND TECHNOLOGY, 1995, 3 (01) :21-28
[54]  
YAMANAKA S, 1995, EUR J SOL STATE INOR, V32, P799
[55]   THEORETICAL-STUDY OF CUBIC STRUCTURES BASED ON FULLERENE CARBON CLUSTERS - C28C AND (C-28)(2) [J].
ZEGER, LM ;
JUAN, YM ;
KAXIRAS, E ;
ANTONELLI, A .
PHYSICAL REVIEW B, 1995, 52 (03) :2125-2130