Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi2(Te0.8Se0.2)3

被引：4

作者：

Das, VD ^{[1
]}

Mallik, RC ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Phys, Thin Film Lab, Madras 600036, Tamil Nadu, India

来源：

THIN SOLID FILMS | 2003年 / 424卷 / 01期

关键词：

thermopower; resistivity; parameter; lattice scattering;

D O I：

10.1016/S0040-6090(02)00919-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Resistivity and thermopower measurements were performed on thin films of Bi-2(Te0.8Se0.2)(3) prepared by flash evaporation technique. Applying the Jain-Verma theory to the experimental data of Bi-2(Te0.8Se0.2)(3), scattering index parameter was evaluated. The value of scattering index parameter was found to lie between -0.3 and -0.2. This indicates the presence of other scattering mechanisms, in addition to the lattice scattering. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：75 / 78

页数：4

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