Contribution to the understanding of the CdTe and Cd1-yZnyTe surface chemistry

被引：23

作者：

Etcheberry, A

Iranzo-Marin, F

Novakovic, E

Triboulet, R

Debiemme-Chouvy, C

机构：

[1] Univ Versailles, UMR CNRS, IREM, Inst React Electrochim & Microporosite, F-78000 Versailles, France

[2] CNRS, LPSB, F-92190 Meudon, France

来源：

JOURNAL OF CRYSTAL GROWTH | 1998年 / 184卷

关键词：

II-VI semiconductors; coating; etching; XPS analysis; electrochemistry;

D O I：

10.1016/S0022-0248(98)80047-X

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (X-AES) measurements coupled with electrochemical characterizations are used to study the chemical surface modifications of CdTe (or CZT) immersed in acidic and basic solutions. Te- or Cd-enriched surfaces are obtained depending on the nature of the oxidation bath. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：213 / 217

页数：5

共 4 条

[1] Detection of cadmium oxides on a CdTe substrate by X-AES [J].