Line-on-line coincidence: A new type of epitaxy found in organic-organic heterolayers

被引：94

作者：

Mannsfeld, SCB ^{[1
]}

Leo, K ^{[1
]}

Fritz, T ^{[1
]}

机构：

[1] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.94.056104

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We propose a new type of epitaxy, line-on-line coincidence (LOL), which explains the ordering in the organic-organic heterolayer system PTCDA on HBC on graphite. LOL epitaxy is similar to point-on-line coincidence (POL) in the sense that all overlayer molecules lie on parallel, equally spaced lines. The key difference to POL is that these lines are not restricted to primitive lattice lines of the substrate lattice. Potential energy calculations demonstrate that this new type of epitaxy is indeed characterized by a minimum in the overlayer-substrate interaction potential.

引用

页数：4

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