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Advances in photoionization and photoelectron studies using third generation synchrotron radiation
被引:4
作者:
Ng, CY
[1
]
机构:
[1] Iowa State Univ, Ames Lab, US DOE, Ames, IA 50011 USA
[2] Iowa State Univ, Dept Chem, Ames, IA 50011 USA
关键词:
photoionization;
third generation synchrotron radiation;
D O I:
10.1016/S0368-2048(00)00144-4
中图分类号:
O433 [光谱学];
学科分类号:
0703 ;
070302 ;
摘要:
In the past few years, we have established a unique high-resolution photoionization-photoelectron facility at the Chemical Dynamics Beamline of the Advanced Light Source. By combining a 6.65-m off-plane Eagle mounted scanning monochromator with the undulator synchrotron radiation source, we have demonstrated photon energy resolving powers up to E/Delta E = 72,000-100,000 in the photon energy range of 6-27 eV. We have also developed novel synchrotron-based pulsed field ionization photoelectron (PFI-PE) detection schemes, achieving resolutions of 1-6 cm(-1) (FWHM). Using the specially designed photoelectron-photoion apparatus, which features a supersonic molecular beam source and opposing electron and ion time-of-flight spectrometers, we have recently succeeded in performing synchrotron-based PFI-PE photoion coincidence experiments, attaining resolutions limited only by the PFI-PE measurements. Most recently, we have demonstrated a generally applicable synchrotron-based scheme for PF1-photoion measurements. The PFI-PEPICO and PFI-PI methods are expected to have a significant impact in future reaction dynamics studies involving the preparation of rovibronically state-selected reactant ions. (C) 2000 Elsevier Science B.V. All rights reserved.
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页码:41 / 45
页数:5
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