Crystal structure of polycrystalline films of quaterthiophene grown by organic molecular beam deposition

被引：27

作者：

Sassella, A

Besana, D

Borghesi, A

Campione, M

Tavazzi, S

Lotz, B

Thierry, A

机构：

[1] INFM, Dipartimento Sci Mat, I-20125 Milan, Italy

[2] Univ Milan, I-20125 Milan, Italy

[3] CNRS, Inst Charles Sadron, F-67083 Strasbourg, France

来源：

SYNTHETIC METALS | 2003年 / 138卷 / 1-2期

关键词：

organic molecular beam deposition; atomic force microscopy; structural characterization; thin film growth; oligothiophenes;

D O I：

10.1016/S0379-6779(02)01288-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The growth of thin films of oligothiophenes by organic molecular beam deposition (OMBD) can produce highly ordered polycrystalline samples. Recently. quaterthiophene (4T) thin films were grown on different substrates (silica, graphite, potassium acid phthalate, silicon). In some cases. their optical behavior was found to resemble that of 4T single crystals, with a macroscopic anisotropy close to that of the bulk crystal. A careful structural characterization of these films was undertaken. A morphological and optical characterization was performed by atomic force microscopy (AFM) and optical absorption. Electron microscopic examination in both bright field and diffraction was carried out on 4T thin films deposited on two selected substrates: silica and single crystals of potassium phthalate acid salt. The crystal polymorph, contact plane, and coherent orientation obtained on these 4T microcrystalline films fully agree with the optical behavior of the samples. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：125 / 130

页数：6

共 12 条

[1] Epitaxial growth of quaterthiophene thin films by organic molecular beam deposition [J].