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Comment on "Electrostatic force microscopy on oriented graphite surfaces: Coexistence of insulating and conducting behaviors"

被引：20
作者：
Sadewasser, S.
Glatzel, Th.
机构：
[1] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany
[2] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
来源：
PHYSICAL REVIEW LETTERS | 2007年 / 98卷 / 26期
关键词：
D O I：
10.1103/PhysRevLett.98.269701
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页数：1
相关论文
共 4 条
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[4]   High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy [J].
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