Large temperature coefficient of resistance in La0.7Ca0.3MnO3 thin films obtained by metal organic deposition process

被引：15

作者：

Daoudi, K ^{[1
]}

Tsuchiya, T ^{[1
]}

Mizuta, S ^{[1
]}

Yamaguchi, L ^{[1
]}

Manabe, T ^{[1
]}

Kumagai, T ^{[1
]}

机构：

[1] AIST, Tsukuba, Ibaraki 3058565, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 8B期

关键词：

thin films; epitaxial growth; MOD; LCMO; TCR;

D O I：

10.1143/JJAP.43.L1054

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

La0.7Ca0.3MnO3 (LCMO) thin films with perovskite structure were successfully grown by metal-organic deposition (MOD) on LaAlO3 (001) substrates. The epitaxial growth of the films was confirmed by X-ray diffraction (theta-2theta scans and pole-figure analysis). The temperature coefficient of resistance (TCR) was calculated from the temperature dependence of the resistance measurements. The effects of annealing temperature and film thickness on the resistance and TCR were investigated. The LCMO thin films present a high resistivity-peak temperature of approximately 264 K. The LCMO thin films obtained by MOD show a maximum TCR. of similar to27.5%/K, and can be considered as good candidates for bolometric applications.

引用

收藏

页码：L1054 / L1056

页数：3

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