Comparative study of confocal and heterodyne microscopy for imaging through scattering media

被引：67

作者：

Kempe, M ^{[1
]}

Rudolph, W ^{[1
]}

Welsch, E ^{[1
]}

机构：

[1] UNIV JENA, INST OPT & QUANTUM ELECTR, JENA, GERMANY

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1996年 / 13卷 / 01期

关键词：

D O I：

10.1364/JOSAA.13.000046

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We investigate limits of the confocal microscope when applied to imaging through scattering layers and compare its performance with that of a correlation (heterodyne) microscope. Confocal laser scanning microscopy is shown to make possible imaging through scattering media owing to the spatial filtering of the signal back-reflected from the sample. Its performance is limited by the noise of the detection system and/or insufficient rejection of scattered light, depending on the sample under investigation. Correlation microscopy with narrow or broad bandwidth light can extend these limits by selective, optical amplification of the image information. (C) 1996 Optical Society of America

引用

页码：46 / 52

页数：7

共 20 条

[1] MICROSCOPE IMAGING THROUGH HIGHLY SCATTERING MEDIA
ANDERSON, GE
LIU, F
ALFANO, RR
[J]. OPTICS LETTERS, 1994, 19 (13) : 981 - 983
[2] Born M., 1989, Principles of Optics, V6th
[3] CHARACTERIZATION OF THE IMAGE-RESOLUTION FOR THE 1ST-ARRIVING-LIGHT METHOD
CHEN, Y
[J]. APPLIED OPTICS, 1994, 33 (13) : 2544 - 2552
[4] Davidson M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V775, P233, DOI 10.1117/12.940433
[5] GOODMAN JW, 1985, STATISTICAL OPTICS
[6] SCATTERING AND DIFFUSION OF A BEAM WAVE IN RANDOMLY DISTRIBUTED SCATTERERS
ISHIMARU, A
KUGA, Y
CHEUNG, RLT
SHIMIZU, K
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (02) : 131 - 136
[7] OPTICAL COHERENCE MICROSCOPY IN SCATTERING MEDIA
IZATT, JA
HEE, MR
OWEN, GM
SWANSON, EA
FUJIMOTO, JG
[J]. OPTICS LETTERS, 1994, 19 (08) : 590 - 592
[8] SCANNING MICROSCOPY THROUGH THICK LAYERS BASED ON LINEAR CORRELATION
KEMPE, M
RUDOLPH, W
[J]. OPTICS LETTERS, 1994, 19 (23) : 1919 - 1921
[9] Kempe M., 1994, Nonlinear Optics, Principles, Materials, Phenomena and Devices, V7, P129
[10] RESOLUTION LIMITS OF MICROSCOPY THROUGH SCATTERING LAYERS
KEMPE, M
THON, A
RUDOLPH, W
[J]. OPTICS COMMUNICATIONS, 1994, 110 (5-6) : 492 - 496

← 1 2 →