The ReflEXAFS station at the GILDA beamline (BM08) of ESRF

被引:41
作者
D'Acapito, F
Davoli, I
Ghigna, P
Mobilio, S
机构
[1] European Synchrotron Radiat Facil, GILDA CRG, INFM OGG, F-38043 Grenoble, France
[2] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Italy
[3] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[4] Univ Pavia, Dipartimento Chim Fis, Pavia, Italy
[5] Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy
关键词
instrumentation; X-ray absorption spectroscopy; X-ray total reflection; solid-state reactions; semiconductor nanodots;
D O I
10.1107/S0909049503005582
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The experimental station for measuring X-ray absorption spectra in total reflection geometry operative at the GILDA CRG beamline of ESRF is described. The main features of the station are shown, namely: the possibility of detecting very small signals from thin (a few ML) samples, of depositing thin films under controlled conditions and thermal treating the samples in order to study dynamical processes. Case studies are reported in order to show the performances of the apparatus.
引用
收藏
页码:260 / 264
页数:5
相关论文
共 54 条
[1]   EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE LOCAL ATOMIC-STRUCTURE IN AS+ HEAVILY IMPLANTED SILICON [J].
ALLAIN, JL ;
REGNARD, JR ;
BOURRET, A ;
PARISINI, A ;
ARMIGLIATO, A ;
TOURILLON, G ;
PIZZINI, S .
PHYSICAL REVIEW B, 1992, 46 (15) :9434-9445
[2]   X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J].
BARCHEWITZ, R ;
CREMONESEVISICATO, M ;
ONORI, G .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21) :4439-4445
[3]   THE LOCAL ATOMIC-STRUCTURE OF THE OXIDE COATING ON POLISHED GAAS(100) [J].
BARRETT, NT ;
GREAVES, GN ;
PIZZINI, S ;
ROBERTS, KJ .
SURFACE SCIENCE, 1990, 227 (03) :337-346
[4]   LOCAL-STRUCTURE OF POROUS SILICON [J].
BAYLISS, SC ;
ANSTEE, P ;
HUTT, DA ;
ZHANG, Q ;
DANSON, N ;
BATES, J ;
WADDILOVE, A .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (09) :5171-5178
[5]   X-RAY-REFLECTIVITY FINE-STRUCTURE AND EXAFS [J].
BORTHEN, P ;
STREHBLOW, HH .
PHYSICAL REVIEW B, 1995, 52 (05) :3017-3019
[6]  
BORTHEN P, 1997, J PHYS, V4, P187
[7]  
BOSIO L, 1984, J ELECTROANAL CHEM, V180, P265, DOI 10.1016/0368-1874(84)83585-6
[8]  
BOSIO L, 1983, VIDE COUCHES MINCES, V216, P197
[9]  
CHARNOCK JM, 1995, PHYSICA B, V209, P457
[10]  
CHEN H, 1989, THESIS CITY U NEW YO