Advances in cubic silicon carbide surfaces and self-organized one dimensional sub-nanoscale objects

被引:33
作者
Soukiassian, P
Semond, F
机构
[1] CEA, SRSIM, DRECAM, DSM,Ctr Etud Saclay, F-91191 Gif Sur Yvette, France
[2] Univ Paris 11, Dept Phys, F-91405 Orsay, France
[3] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA
来源
JOURNAL DE PHYSIQUE IV | 1997年 / 7卷 / C6期
关键词
D O I
10.1051/jp4:1997609
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We review the most recent advances into the knowledge and the understanding of cubic silicon carbide beta-SiC(100) surfaces. These investigations are based on the use of advanced experimental techniques such as photoemission spectroscopies with x-rays and synchrotron radiation sources, atom-resolved scanning tunneling microscopy, complementary low energy electron diffraction for characterisation, and state-of-the-art theoretical methods such as total energy ab-initio calculations using the local density functional approximation and scanning tunneling microscopy image simulations. Surface preparation and morphology, atomic geometry, reconstructions, phase transition and the discovery of self-organized Si atomic lines having fascinating characteristics are described for Si-terminated beta-SiC(100) surfaces. Such important issues as e.g. the role of defects or stress in surface atomic ordering will be addressed. These investigations brings deep insights into the knowledge and understanding of technologically important silicon carbide surfaces and reveal a novel aspect of SiC in its ability to be a very suitable material in nanotechnologies and micro/nano-electronics of the future.
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页码:101 / 113
页数:13
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