Determination of spherosiloxane cluster bonding to Si(100)-2 x 1 by scanning tunneling microscopy

被引：21

作者：

Schneider, KS ^{[1
]}

Zhang, Z

Holl, MMB

Orr, BG

Pernisz, UC

机构：

[1] Univ Michigan, Dept Chem, Ann Arbor, MI 48109 USA

[2] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

[3] Dow Corning Corp, Phys Exptertise Ctr, Midland, MI 48686 USA

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.85.602

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Scanning tunneling microscopy is used to determine the bonding geometry of the spherosiloxane cluster, H8Si8O12, on Si(100)-2 x 1. The images obtained are consistent with monovertex bonding to the Si(100)-2 x 1 surface via activation of a single Si-H bond. Filled and empty state images show good agreement with calculations of the electron density distribution of the cluster as well as the Psi(2) highest occupied molecular orbital and lowest unoccupied molecular orbital surface plots of the cluster.

引用

页码：602 / 605

页数：4