Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy

被引：141

作者：

Ohnishi, T

Ohtomo, A

Kawasaki, M

Takahashi, K

Yoshimoto, M

Koinuma, H

机构：

[1] Tokyo Inst Technol, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 226, Japan

[2] Tokyo Inst Technol, Dept Innovat & Engn Mat, Midori Ku, Yokohama, Kanagawa 226, Japan

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 07期

关键词：

D O I：

10.1063/1.120905

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have identified the surface polar structure of wurtzite-type ZnO films by coaxial impact-collision ion scattering spectroscopy. High-quality ZnO epitaxial films were prepared on sapphire (alpha-Al2O3) (0001) substrates by laser molecular beam epitaxy using a ZnO ceramic target. The (000 (1) over bar) crystallographic plane (the O face) was found to terminate the top surface of the ZnO film by comparing spectra of the films with those of well-defined (0001) and (000 (1) over bar) surfaces of bulk single crystals. The preferential [000 (1) over bar] growth direction of ZnO films is discussed from the viewpoints of the chemical interaction at the interface and surface stability against sublimation. (C) 1998 American Institute of Physics.

引用

页码：824 / 826

页数：3

共 15 条

[1] A SURFACE-COMPOSITION STUDY OF SULFIDED COBALT MOLYBDENUM CATALYSTS BY LOW-ENERGY ION-SCATTERING SPECTROMETRY (ISS) [J].