Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

被引：22

作者：

Adam, PM

Royer, P

Laddada, R

Bijeon, JL

机构：

[1] Laboratoire de Nanotechnologie et d′Instrumentation Optique, Université de Technologie de Troyes, Troyes Cedex, 10010

来源：

APPLIED OPTICS | 1998年 / 37卷 / 10期

关键词：

D O I：

10.1364/AO.37.001814

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light. (C) 1998 Optical Society of America.

引用

页码：1814 / 1819

页数：6

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