Derivation of length of carbon nanotube responsible for electron emission from field emission characteristics

被引：12

作者：

Gotoh, Y. ^{[1
]}

Kawamura, Y.

Niiya, T.

Ishibashi, T.

Nicolaescu, D.

Tsuji, H.

Ishikawa, J.

Hosono, A.

Nakata, S.

Okuda, S.

机构：

[1] Kyoto Univ, Nishikyo Ku, Dept Elect Sci & Engn, Kyoto 6158510, Japan

[2] Kyoto Univ, Nishikyo Ku, Ion Beam Engn Expt Lab, Kyoto 6158510, Japan

[3] Mitsubishi Electr Corp, Amagasaki, Hyogo 6618661, Japan

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 20期

关键词：

D O I：

10.1063/1.2740199

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A method for deriving the length of carbon nanotube (CNT) in field emission arrays is proposed. Unlike the direct method of observation using a microscope, this method gathers information from functional measurements. Electron emission characteristics of CNT's printed on glass substrate were measured in a diode configuration. The macroscopic part of the voltage field conversion factor beta was obtained from the relationship between the slope and intercept of the Fowler-Nordheim plot, and also from modeling of the electrodes. The length of the CNT was derived comparing the two values for beta. The estimated length of the CNT agrees with direct measurements.

引用

页数：3

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