In-plane magnetoconductivity of Si MOSFETs: A quantitative comparison of theory and experiment

被引:61
作者
Vitkalov, SA [1 ]
James, K
Narozhny, BN
Sarachik, MP
Klapwijk, TM
机构
[1] CUNY City Coll, Dept Phys, New York, NY 10031 USA
[2] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA
[3] Delft Univ Technol, Dept Appl Phys, NL-2628 CJ Delft, Netherlands
关键词
D O I
10.1103/PhysRevB.67.113310
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
For densities above n=1.6x10(11) cm(-2) in the strongly interacting system of electrons in two-dimensional silicon inversion layers, excellent agreement between experiment and the theory of Zala, Narozhny, and Aleiner is obtained for the response of the conductivity to a magnetic field applied parallel to the plane of the electrons. The parameters deduced from fits to the magnetoconductance do not provide quantitative agreement with the observed zero-field temperature dependence. We attribute this to the neglect in the theory of additional scattering terms, which affect the temperature dependence more strongly than the field dependence.
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页数:4
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