3-D measurement of deformation microstructure in Al(0.2%)Mg using submicron resolution white X-ray microbeams

被引：15

作者：

Larson, BC ^{[1
]}

Tamura, N ^{[1
]}

Chung, JS ^{[1
]}

Ice, GE ^{[1
]}

Budai, JD ^{[1
]}

Tischler, JZ ^{[1
]}

Yang, W ^{[1
]}

Weiland, H ^{[1
]}

Lowe, WP ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37830 USA

来源：

APPLICATIONS OF SYNCHROTRON RADIATION TECHNIQUES TO MATERIALS SCIENCE V | 2000年 / 590卷

关键词：

D O I：

10.1557/PROC-590-247

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have used submicron-resolution white x-ray microbeams on the MHATT-CAT beamline 7-ID at the Advanced Photon Source to develop techniques for three-dimensional investigation of the deformation microstructure in a 20% plane strain compressed Al(0.2%)Mg tri-crystal. Kirkpatrick-Baez mirrors were used to focus white radiation from an undulator to a 0.7 x 0.7 mu m(2) beam that was scanned over bi- and tri-crystal regions near the triple-junction of the tricrystal. Depth resolution along the x-ray microbeam of less than 5 microns was achieved by triangulation to the diffraction source point using images taken at a series of CCD distances from the microbeam. Computer indexing of the deformation cell structure in the bi-crystal region provided orientations of individual subgrains to similar to 0.01 degrees, making possible detailed measurements of the rotation axes between individual cells.

引用

页码：247 / 252

页数：6

共 8 条

[1] X-ray microbeam measurement of local texture and strain in metals [J].