Effect of the electromagnetic environment on Coulomb blockade devices: Model, experiments, and method of analysis

被引:22
作者
Wahlgren, P [1 ]
Delsing, P
Claeson, T
Haviland, DB
机构
[1] Chalmers Univ Technol, Dept Microelect & Nanosci, S-41296 Gothenburg, Sweden
[2] Gothenburg Univ, S-41296 Gothenburg, Sweden
[3] Royal Inst Technol, Dept Phys, S-10044 Stockholm, Sweden
来源
PHYSICAL REVIEW B | 1998年 / 57卷 / 04期
关键词
D O I
10.1103/PhysRevB.57.2375
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of the electromagnetic environment on Coulomb blockade devices can be estimated through a simple horizon model where the interaction length is determined by the Heisenberg uncertainty principle. The advantage of this horizon model can be demonstrated in a device with two tunnel junctions in parallel where a cutoff voltage related to physical dimensions is observed. This model also explains the characteristics of single junctions and single-electron tunneling (SET) transistors. Several Al/AlOx/Al devices of various geometries were measured and the effective Coulomb barrier has been investigated through the offset voltage defined as V-off = V-IdV/dI. We have also used V-off to determine the capacitances of SET transistors, from which we determined microstrip capacitance as a function of island size.
引用
收藏
页码:2375 / 2381
页数:7
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