Plasma damage-free deposition of Al cathode on organic light-emitting devices by using mirror shape target sputtering

被引:34
作者
Kim, HK
Kim, DG
Lee, KS
Huh, MS
Jeong, SH
Kim, KI
Kim, H
Han, DW
Kwon, JH
机构
[1] Samsung SDI Co LTD, Core Technol Lab, Suwon 442391, South Korea
[2] Samsung SDI Co LTD, Corp R&D Ctr, Yongin 449902, Gyeonggi Do, South Korea
关键词
D O I
10.1063/1.1815394
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the fabrication of plasma damage-free organic light-emitting devices (OLEDs) by using a mirror shape target sputtering (MSTS) technique. It is shown that OLEDs with Al cathode deposited by the MSTS show much lower leakage current (1x10(-5) mA/cm(2)) at reverse bias of -6 V, compared to that (1x10(-1)-similar to10(-2) mA/cm(2) at -6 V) of OLEDs with Al cathodes grown by conventional dc magnetron sputtering. This indicates that there is no plasma damage, which is caused by the bombardment of energetic particles. This suggests that MSTS could be a useful plasma damage-free and low-temperature deposition technique for both top- and bottom-emitting OLEDs and flexible displays. (C) 2004 American Institute of Physics.
引用
收藏
页码:4295 / 4297
页数:3
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