Development of AFM potentiometry for potential mapping of organic conductors

被引：17

作者：

Nakamura, M ^{[1
]}

Fukuyo, M ^{[1
]}

Wakata, E ^{[1
]}

Iizuka, M ^{[1
]}

Kudo, K ^{[1
]}

Tanaka, K ^{[1
]}

机构：

[1] Chiba Univ, Dept Elect & Mech Engn, Inage Ku, Chiba 2638522, Japan

来源：

SYNTHETIC METALS | 2003年 / 137卷 / 1-3期

关键词：

atomic force microscopy; potential mapping; conductivity; organic semiconductor; organic conductor; charge transfer complex;

D O I：

10.1016/S0379-6779(02)01126-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A novel technique, AFM potentiometry (AFMP), for nanoscale potential mapping has been developed by combining an intermittent-contact-mode AFM with a conductive cantilever which is connected to an electrometer. Potential resolution and limitations of the technique are discussed. TTF-TCNQ wire-like crystals connecting two electrodes were measured with the AFMP under application of a voltage to the electrodes. The potential image indicated that the resistance localized at the grain boundaries was much larger than that distributed within the grains.

引用

页码：887 / 888

页数：2

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