Direct imaging of multimode interference in a channel waveguide

被引:14
作者
Campillo, AL
Hsu, JWP
Parameswaran, KR
Fejer, MM
机构
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[2] Univ Virginia, Charlottesville, VA 22904 USA
[3] Stanford Univ, Stanford, CA 94305 USA
关键词
D O I
10.1364/OL.28.000399
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
By use of a near-field scanning optical microscope in collection mode, multimode interference was directly measured in an annealed proton-exchanged LiNbO3 waveguide. Periodic transitions from a single-peaked Gaussianlike intensity distribution to a double-peaked intensity distribution were observed. The intensity distribution along the waveguide was calculated, and the results. agree well with the experimental observation. (C) 2003 Optical Society of America.
引用
收藏
页码:399 / 401
页数:3
相关论文
共 17 条
  • [1] ANNEALED PROTON-EXCHANGED LINBO3 WAVE-GUIDES
    BORTZ, ML
    FEJER, MM
    [J]. OPTICS LETTERS, 1991, 16 (23) : 1844 - 1846
  • [2] Mapping the optical intensity distribution in photonic crystals using a near-field scanning optical microscope
    Campillo, AL
    Hsu, JWP
    White, CA
    Rosenberg, A
    [J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) : 2801 - 2807
  • [3] CAMPILLO AL, 2002, THESIS U VIRGINIA CH
  • [4] NEAR-FIELD MEASUREMENTS OF OPTICAL CHANNEL WAVE-GUIDES AND DIRECTIONAL-COUPLERS
    CHOO, AG
    JACKSON, HE
    THIEL, U
    DEBRABANDER, GN
    BOYD, JT
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (08) : 947 - 949
  • [5] 1.5-μm-band wavelength conversion based on cascaded second-order nonlinearity in LiNbO3 waveguides
    Chou, MH
    Brener, I
    Fejer, MM
    Chaban, EE
    Christman, SB
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1999, 11 (06) : 653 - 655
  • [6] A NONOPTICAL TIP-SAMPLE DISTANCE CONTROL METHOD FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY USING IMPEDANCE CHANGES IN AN ELECTROMECHANICAL SYSTEM
    HSU, JWP
    LEE, M
    DEAVER, BS
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (05) : 3177 - 3181
  • [7] Chemically etched fiber tips for near-field optical microscopy: a process for smoother tips
    Lambelet, P
    Sayah, A
    Pfeffer, M
    Philipona, C
    Marquis-Weible, F
    [J]. APPLIED OPTICS, 1998, 37 (31): : 7289 - 7292
  • [8] An impedance based non-contact feedback control system for scanning probe microscopes
    Lee, M
    McDaniel, EB
    Hsu, JWP
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (04) : 1468 - 1471
  • [9] NEW FORM OF SCANNING OPTICAL MICROSCOPY
    REDDICK, RC
    WARMACK, RJ
    FERRELL, TL
    [J]. PHYSICAL REVIEW B, 1989, 39 (01): : 767 - 770
  • [10] Internal spatial modes in glass microring resonators
    Rhodes, GHV
    Goldberg, BB
    Ünlü, MS
    Chu, ST
    Little, BE
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2000, 6 (01) : 46 - 53