共 57 条
Threshold voltage shift in organic field effect transistors by dipole monolayers on the gate insulator
被引:503
作者:

Pernstich, KP
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机构:
ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Haas, S
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Oberhoff, D
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Goldmann, C
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Gundlach, DJ
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Batlogg, B
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Rashid, AN
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Schitter, G
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机构: ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland
机构:
[1] ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland
[2] ETH, Inst Quantum Elect, CH-8093 Zurich, Switzerland
[3] ETH, Nanotechnol Grp, CH-8093 Zurich, Switzerland
关键词:
D O I:
10.1063/1.1810205
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We demonstrate controllable shift of the threshold voltage and the turn-on voltage in pentacene thin film transistors and rubrene single crystal field effect transistors (FET) by the use of nine organosilanes with different functional groups. Prior to depositing the organic semiconductors, the organosilanes were applied to the SiO2 gate insulator from solution and form a self-assembled monolayer (SAM). The observed shifts of the transfer characteristics range from -2 to 50 V and can be related to the surface potential of the layer next to the transistor channel. Concomitantly the mobile charge carrier concentration at zero gate bias reaches up to 4x10(12)/cm(2). In the single crystal FETs the measured transfer characteristics are also shifted, while essentially maintaining the high quality of the subthreshold swing. The shift of the transfer characteristics is governed by the built-in electric field of the SAM and can be explained using a simple energy level diagram. In the thin film devices, the subthreshold region is broadened, indicating that the SAM creates additional trap states, whose density is estimated to be of order 1x10(12)/cm(2). (C) 2004 American Institute of Physics.
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页码:6431 / 6438
页数:8
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共 57 条
[1]
MOISTURE ABSORPTION CHARACTERISTICS OF ORGANOSILOXANE SELF-ASSEMBLED MONOLAYERS
[J].
ANGST, DL
;
SIMMONS, GW
.
LANGMUIR,
1991, 7 (10)
:2236-2242

ANGST, DL
论文数: 0 引用数: 0
h-index: 0
机构: LEHIGH UNIV,ZETTLEMOYER CTR SURFACE STUDIES,BETHLEHEM,PA 18015

SIMMONS, GW
论文数: 0 引用数: 0
h-index: 0
机构: LEHIGH UNIV,ZETTLEMOYER CTR SURFACE STUDIES,BETHLEHEM,PA 18015
[2]
The effect of deep traps on carrier hopping in disordered organic materials
[J].
Arkhipov, VI
;
Reynaert, J
;
Jin, YD
;
Heremans, P
;
Emelianova, EV
;
Adriaenssens, GJ
;
Bässler, H
.
SYNTHETIC METALS,
2003, 138 (1-2)
:209-212

Arkhipov, VI
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Reynaert, J
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Jin, YD
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Heremans, P
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Emelianova, EV
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Adriaenssens, GJ
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium

Bässler, H
论文数: 0 引用数: 0
h-index: 0
机构: IMEC, B-3001 Heverlee, Belgium
[3]
Morphology identification of the thin film phases of vacuum evaporated pentacene on SIO2 substrates
[J].
Bouchoms, IPM
;
Schoonveld, WA
;
Vrijmoeth, J
;
Klapwijk, TM
.
SYNTHETIC METALS,
1999, 104 (03)
:175-178

Bouchoms, IPM
论文数: 0 引用数: 0
h-index: 0
机构: Univ Groningen, Dept Appl Phys, NL-9747 AG Groningen, Netherlands

Schoonveld, WA
论文数: 0 引用数: 0
h-index: 0
机构: Univ Groningen, Dept Appl Phys, NL-9747 AG Groningen, Netherlands

Vrijmoeth, J
论文数: 0 引用数: 0
h-index: 0
机构: Univ Groningen, Dept Appl Phys, NL-9747 AG Groningen, Netherlands

Klapwijk, TM
论文数: 0 引用数: 0
h-index: 0
机构: Univ Groningen, Dept Appl Phys, NL-9747 AG Groningen, Netherlands
[4]
Organic semiconductors:: A theoretical characterization of the basic parameters governing charge transport
[J].
Brédas, JL
;
Calbert, JP
;
da Silva, DA
;
Cornil, J
.
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA,
2002, 99 (09)
:5804-5809

Brédas, JL
论文数: 0 引用数: 0
h-index: 0
机构: Univ Arizona, Dept Chem, Tucson, AZ 85721 USA

Calbert, JP
论文数: 0 引用数: 0
h-index: 0
机构: Univ Arizona, Dept Chem, Tucson, AZ 85721 USA

da Silva, DA
论文数: 0 引用数: 0
h-index: 0
机构: Univ Arizona, Dept Chem, Tucson, AZ 85721 USA

Cornil, J
论文数: 0 引用数: 0
h-index: 0
机构: Univ Arizona, Dept Chem, Tucson, AZ 85721 USA
[5]
Controlling Schottky energy barriers in organic electronic devices using self-assembled monolayers
[J].
Campbell, IH
;
Rubin, S
;
Zawodzinski, TA
;
Kress, JD
;
Martin, RL
;
Smith, DL
;
Barashkov, NN
;
Ferraris, JP
.
PHYSICAL REVIEW B,
1996, 54 (20)
:14321-14324

Campbell, IH
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Rubin, S
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Zawodzinski, TA
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Kress, JD
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Martin, RL
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Smith, DL
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Barashkov, NN
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA

Ferraris, JP
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV TEXAS, RICHARDSON, TX 75083 USA UNIV TEXAS, RICHARDSON, TX 75083 USA
[6]
Field-effect transistors on tetracene single crystals
[J].
de Boer, RWI
;
Klapwijk, TM
;
Morpurgo, AF
.
APPLIED PHYSICS LETTERS,
2003, 83 (21)
:4345-4347

de Boer, RWI
论文数: 0 引用数: 0
h-index: 0
机构:
Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands

Klapwijk, TM
论文数: 0 引用数: 0
h-index: 0
机构:
Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands

Morpurgo, AF
论文数: 0 引用数: 0
h-index: 0
机构:
Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Phys, Dept Nanosci, NL-2628 CJ Delft, Netherlands
[7]
Molecular beam deposited thin films of pentacene for organic field effect transistor applications
[J].
Dimitrakopoulos, CD
;
Brown, AR
;
Pomp, A
.
JOURNAL OF APPLIED PHYSICS,
1996, 80 (04)
:2501-2508

Dimitrakopoulos, CD
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS

Brown, AR
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS

Pomp, A
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS PHILIPS RES LABS,NL-5656 AA EINDHOVEN,NETHERLANDS
[8]
Spatially correlated charge transport in organic thin film transistors
[J].
Dinelli, F
;
Murgia, M
;
Levy, P
;
Cavallini, M
;
Biscarini, F
;
de Leeuw, DM
.
PHYSICAL REVIEW LETTERS,
2004, 92 (11)
:116802-1

Dinelli, F
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy

Murgia, M
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy

Levy, P
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy

Cavallini, M
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy

Biscarini, F
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy

de Leeuw, DM
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Studio Mat Nanostrutturati, Sez Bologna, I-40129 Bologna, Italy
[9]
Hole mobility in organic single crystals measured by a "flip-crystal" field-effect technique
[J].
Goldmann, C
;
Haas, S
;
Krellner, C
;
Pernstich, KP
;
Gundlach, DJ
;
Batlogg, B
.
JOURNAL OF APPLIED PHYSICS,
2004, 96 (04)
:2080-2086

Goldmann, C
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Haas, S
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Krellner, C
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Pernstich, KP
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Gundlach, DJ
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland

Batlogg, B
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland Swiss Fed Inst Technol, Solid State Phys Lab, CH-8093 Zurich, Switzerland
[10]
Bias-induced threshold voltages shifts in thin-film organic transistors
[J].
Gomes, HL
;
Stallinga, P
;
Dinelli, F
;
Murgia, M
;
Biscarini, F
;
de Leeuw, DM
;
Muck, T
;
Geurts, J
;
Molenkamp, LW
;
Wagner, V
.
APPLIED PHYSICS LETTERS,
2004, 84 (16)
:3184-3186

Gomes, HL
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Stallinga, P
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Dinelli, F
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Murgia, M
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Biscarini, F
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

de Leeuw, DM
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Muck, T
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Geurts, J
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Molenkamp, LW
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal

Wagner, V
论文数: 0 引用数: 0
h-index: 0
机构: Univ Algarve, Fac Sci & Technol, P-8000 Faro, Portugal