Second-harmonic and sum-frequency imaging of organic nanocrystals with photon scanning tunneling microscope

被引：37

作者：

Shen, YZ ^{[1
]}

Swiatkiewicz, J

Winiarz, J

Markowicz, P

Prasad, PN

机构：

[1] SUNY Buffalo, Photon Res Lab, Inst Lasers Photon & Biophoton, Dept Chem, Buffalo, NY 14260 USA

[2] SUNY Buffalo, Photon Res Lab, Inst Lasers Photon & Biophoton, Dept Phys, Buffalo, NY 14260 USA

[3] SUNY Buffalo, Photon Res Lab, Inst Lasers Photon & Biophoton, Dept Elect Engn & Med, Buffalo, NY 14260 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 19期

关键词：

D O I：

10.1063/1.1322629

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Second-harmonic generation and sum-frequency generation with photon scanning tunneling microscopy and shear-force detection are used to map the nonlinear optical response and the surface topograph of N-(4-nitrophenyl)-(L)-prolinol crystals with a subdiffraction-limited resolution. The domain-size dependence of the spatial feature is obtained, which shows the local orientational distribution of the optical near field radiated by nonlinear nanocrystals and reveals the difference between nanoscopic and macroscopic second-order optical nonlinearities of molecular crystals. (C) 2000 American Institute of Physics. [S0003-6951(00)00145-5].

引用

页码：2946 / 2948

页数：3

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