Renormalized ellipsometry for determining the anisotropic refractive indices of nematic liquid crystals

被引：20

作者：

Tanaka, N ^{[1
]}

Kimura, M ^{[1
]}

Akahane, T ^{[1
]}

机构：

[1] Nagaoka Univ Technol, Fac Engn, Dept Elect Engn, Niigata 9402188, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2003年 / 42卷 / 2A期

关键词：

nematic liquid crystal; ellipsometry; birefringence; refractive index;

D O I：

10.1143/JJAP.42.486

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Renormalized transmission ellipsometry was applied to the precise measurement of anistropic refractive indices of nematic liquid crystals. It is quite beneficial for electrical industry that the conventional sandwich-type liquid crystal cell becomes an applicable sample and experimental measurement can be carried out using a conventional instrument for transmission ellipsometry. A simplified measurement procedure can provide continuous values of refractive indices within the visible wavelength range. At the same time, the cell gap and twist angle of the liquid crystal cell can be estimated by this measurement precisely.

引用

页码：486 / 491

页数：6

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