Metal-coated carbon nanotube tips for magnetic force microscopy

被引：108

作者：

Deng, ZF ^{[1
]}

Yenilmez, E

Leu, J

Hoffman, JE

Straver, EWJ

Dai, HJ

Moler, KA

机构：

[1] Stanford Univ, Dept Phys, Stanford, CA 94305 USA

[2] Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA

[3] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA

[4] Stanford Univ, Dept Chem, Stanford, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 25期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.1842374

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We fabricated cantilevers for magnetic force microscopy with carbon nanotube tips coated with magnetic material. Images of a custom hard drive demonstrated 20 nm lateral resolution, with prospects for further improvements. (C) 2004 American Institute of Physics.

引用

页码：6263 / 6265

页数：3

共 13 条

[11] Wafer scale production of carbon nanotube scanning probe tips for atomic force microscopy [J].

Yenilmez, E ;

Wang, Q ;

Chen, RJ ;

Wang, DW ;

Dai, HJ .

APPLIED PHYSICS LETTERS, 2002, 80 (12) :2225-2227

[12] Quantitative analysis of the magnetic properties of metal-capped carbon nanotube probe [J].

Yoshida, N ;

Yasutake, M ;

Arie, T ;

Akita, S ;

Nakayama, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (7B) :5013-5016

[13] Formation of metal nanowires on suspended single-walled carbon nanotubes [J].

Zhang, Y ;

Dai, HJ .

APPLIED PHYSICS LETTERS, 2000, 77 (19) :3015-3017

← 1 2 →