Chopping frequency variation of photoacoustic amplitude from porous silicon

被引：14

作者：

Ohmukai, M ^{[1
]}

Tsutsumi, Y ^{[1
]}

机构：

[1] Akashi Coll Technol, Dept Elect Engn, Akashi, Hyogo 6748501, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 2A期

关键词：

porous silicon; photoacoustic spectroscopy; chopping frequency;

D O I：

10.1143/JJAP.39.448

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigated the possibility of applying photoacoustic (PA) spectroscopy to the study of luminescent porous silicon. Since porous silicon is usually formed on a silicon substrate, PA spectroscopy is useful for obtaining the absorption coefficient of porous silicon without removing the substrate. In this article, we investigated the chopping frequency dependence of the PA signal from porous silicon and showed that the chopping frequency is critical for the exclusion of the PA signal from silicon substrate.

引用

页码：448 / 449

页数：2

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