Oxygen content of YBaCuO thin films

被引：41

作者：

Degoy, S

Jimenez, J

Martin, P

Martinez, O

Prieto, AC

Chambonnet, D

Audry, C

Belouet, C

Perriere, J

机构：

[1] ESCUELA TECN SUPER INGN IND, E-47011 VALLADOLID, SPAIN

[2] ALCATEL ALSTHOM RECH, F-91460 MARCOUSSIS, FRANCE

[3] FAC CIENCIAS, E-47011 VALLADOLID, SPAIN

[4] UNIV PARIS 07, PHYS SOLIDES GRP, F-75005 PARIS, FRANCE

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1996年 / 256卷 / 3-4期

关键词：

D O I：

10.1016/0921-4534(95)00666-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBCO thin films are studied by means of Raman spectroscopy and X-ray diffraction. Data concerning oxygenation present significant dispersion as obtained from one or the other technique. This reveals structural distortion in addition to that induced by oxygen vacancies in the Cu-O chains. A linear relation between the frequency of the Raman mode associated with the stretching along the c-axis of the apical oxygen and the deviation of the perfect Ba and Cu stoichiometry is observed. A similar linear relation is obtained as well for the intensity ratio of the high index reflections of the XRD spectrum (I-005/I-006,). Such a relation is not seen for the c-axis length, which suggests that the structural distortion associated with departures from cation stoichiometry is different for c*z[Cu(2)] and c*(1-2z[Cu(2)]) in the orthorhombic structure of YBCO. Other factors contributing to the uncertainty in the oxygen assessment in thin films are discussed.

引用

页码：291 / 297

页数：7

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