Photoluminescence and free carrier interactions in erbium-doped GaAs

被引:30
作者
Culp, TD
Cederberg, JG
Bieg, B
Kuech, TF
Bray, KL
Pfeiffer, D
Winter, CH
机构
[1] Univ Wisconsin, Dept Chem Engn, Madison, WI 53706 USA
[2] Wayne State Univ, Dept Chem, Detroit, MI 48202 USA
关键词
D O I
10.1063/1.367293
中图分类号
O59 [应用物理学];
学科分类号
摘要
The photoluminescence properties of GaAs:Er doped with a new pyrazole and pyridine-based Er source, tris(3,5-di-tert-butylpyrazolato)bis(4-tert-butylpyridine)erbium(III) were investigated. These samples showed significantly stronger and sharper 1.54 mu m Er3+ luminescence than in GaAs:Er samples doped with cyclopentadienyl-based Er sources. The efficient luminescence was associated with the Er-2O center, formed with unintentional oxygen impurities. The Er3+ emission was greatly reduced in n-type samples, whereas the emission remained strong in p-type samples. This trend suggests that either the free hole concentration is very important to the Er3+ excitation efficiency, and/or there is a strong Auger quenching mechanism which involves free electrons. A model based on the results of a two-beam experiment indicates the presence of strong Auger energy transfer from the Er-bound exciton to a free electron. Auger energy transfer from the excited Er3+ ion to a free electron was found to be much less important. The temperature dependence of the Er3+ emission was also examined. A decrease in intensity was observed at the lowest temperatures. This effect was attributed to the freeze-out of carriers onto a relatively shallow trap which could be related to either Er or shallow accepters. (C) 1998 American Institute of Physics.
引用
收藏
页码:4918 / 4927
页数:10
相关论文
共 33 条
[1]  
ADACHI S, 1994, GAAS RELATED MAT BUL, pCH14
[2]   TIME-RESOLVED PHOTOLUMINESCENCE SPECTROSCOPY FROM ERBIUM-DOPED GA0.55AL0.45AS [J].
BENYATTOU, T ;
SEGHIER, D ;
GUILLOT, G ;
MONCORGE, R ;
GALTIER, P ;
CHARASSE, MN .
APPLIED PHYSICS LETTERS, 1991, 58 (19) :2132-2134
[3]  
BLAKEMORE JS, 1987, SEMICONDUCTOR STAT, pCH6
[4]  
CEDERBERG JG, UNPUB J APPL PHYS
[5]  
COFFA S, 1996, MAT RES SOC S P 1996, V422
[6]   Photoluminescence studies of erbium-doped GaAs under hydrostatic pressure [J].
Culp, TD ;
Hommerich, U ;
Redwing, JM ;
Kuech, TF ;
Bray, KL .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (01) :368-374
[7]   RADIATIVE AND NONRADIATIVE-TRANSITIONS IN GAAS-ER [J].
FANG, XM ;
LI, YB ;
LANGER, DW .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (11) :6990-6992
[8]   Mechanism and performance of forward and reverse bias electroluminescence at 1.54 mu m from Er-doped Si diodes [J].
Franzo, G ;
Coffa, S ;
Priolo, F ;
Spinella, C .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (06) :2784-2793
[9]   Excitation and de-excitation of Yb3+ in InP and Er3+ in Si: Photoluminescence and impact ionization studies [J].
Gregorkiewicz, T ;
Tsimperidis, I ;
Ammerlaan, CAJ ;
Widdershoven, FP ;
Sobolev, NA .
RARE EARTH DOPED SEMICONDUCTORS II, 1996, 422 :207-218
[10]  
GREGORKIEWICZ T, 1993, MATER RES SOC SYMP P, V301, P239, DOI 10.1557/PROC-301-239