Study of field emission characteristics of carbon with the scanning atom probe

被引:11
作者
Watanabe, M
Yagyu, T
Nishikawa, O
Yamaguchi, T
Choi, N
Tokumoto, H
Nakano, S
机构
[1] Kanazawa Inst Technol, Dept Mat Sci & Engn, Nonoichi, Ishikawa 9218501, Japan
[2] Shizuoka Univ, Coll Engn, Shizuoka 4228529, Japan
[3] Tokyo Metropolitan Univ, Dept Chem, Fac Sci, Hachioji, Tokyo 1920397, Japan
[4] Natl Inst Adv Ind Sci & Technol, Nanotechnol Res Inst, Tsukuba, Ibaraki 3058562, Japan
[5] Mech Engn Lab, Tsukuba, Ibaraki 3058564, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2002年 / 41卷 / 12期
关键词
atom probe; carbon nanotube; F-N plot; artificial diamond; field emission;
D O I
10.1143/JJAP.41.7469
中图分类号
O59 [应用物理学];
学科分类号
摘要
After obtaining the Fowler-Nordheim plot (F-N plot) of various carbon specimens including artificial diamonds and carbon nanotubes (CNTs), the Surface composition of the specimens is analyzed by the scanning atom probe (SAP). Since the emitters vary from a sharp and slender CNT to a dull corner of a small diamond grain, the slope of the F-N plot is hardly related to the work function. Accordingly, the slope and intercept of the F-N plot are plotted on a Sasaki-Kaneko (S-K) chart. Even when the slopes of the F-N plots vary in a wide range, the points corresponding to the slopes and intercepts of the F-N plots are aligned on the S-K chart as suggested by the analytical calculation of the field strength directly above the emitter surface. Our results indicate that the work function of CNTs is smaller than that of the other carbon specimens and increases with the removal of the absorbed hydrogen.
引用
收藏
页码:7469 / 7475
页数:7
相关论文
共 10 条
[1]  
Good R. H., 1956, HDB PHYSIK, V4, P176
[2]   ESTIMATION OF METAL-DEPOSITED FIELD EMITTERS FOR THE MICRO-VACUUM TUBE [J].
ISHIKAWA, J ;
TSUJI, H ;
INOUE, K ;
NAGAO, M ;
SASAKI, T ;
KANEKO, T ;
GOTOH, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1993, 32 (3A) :L342-L345
[3]  
Muller E.W., 1969, FIELD ION MICROSCOPY
[4]   TOWARD A SCANNING ATOM-PROBE - COMPUTER-SIMULATION OF ELECTRIC-FIELD [J].
NISHIKAWA, O ;
KIMOTO, M .
APPLIED SURFACE SCIENCE, 1994, 76 (1-4) :424-430
[5]   Development of a scanning atom probe and atom-by-atom mass analysis of diamonds [J].
Nishikawa, O ;
Sekine, T ;
Ohtani, Y ;
Maeda, K ;
Numada, Y ;
Watanabe, M ;
Iwatsuki, M ;
Aoki, S ;
Itoh, J ;
Yamanaka, K .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S11-S16
[6]   Atomic level analysis of silicon emitters utilizing the scanning atom probe [J].
Nishikawa, O ;
Watanabe, M ;
Ohtani, Y ;
Maeda, K ;
Tanaka, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (02) :942-947
[7]   Atom-by-atom analysis of diamond, graphite, and vitreous carbon by the scanning atom probe [J].
Nishikawa, O ;
Ohtani, Y ;
Maeda, K ;
Watanabe, M ;
Tanaka, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (02) :653-660
[8]  
NISHIKAWA O, 2000, MAT CHARACTER, V29, P44
[9]   PHYSICAL-PROPERTIES OF THIN-FILM FIELD-EMISSION CATHODES WITH MOLYBDENUM CONES [J].
SPINDT, CA ;
BRODIE, I ;
HUMPHREY, L ;
WESTERBERG, ER .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (12) :5248-5263
[10]  
YAMAGUCHI T, IN PRESS