Sulfonation of poly(N-vinylcarbazole) studied by combined time of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy

被引：13

作者：

Weng, LT ^{[1
]}

Wong, PCL ^{[1
]}

Ho, K ^{[1
]}

Wang, SH ^{[1
]}

Zeng, ZH ^{[1
]}

Yang, SH ^{[1
]}

机构：

[1] Hong Kong Univ Sci & Technol, Mat Characterizat & Preparat Facil, Kowloon, Hong Kong, Peoples R China

来源：

ANALYTICAL CHEMISTRY | 2000年 / 72卷 / 20期

关键词：

D O I：

10.1021/ac000152c

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A series of sulfonated poly(N-vinylcarbazole) (PVK) samples have been systematically studied by time-of-flight secondary ion mass spectrometry (TOF-SMS) and X-ray photoelectron spectroscopy (XPS). Negative TOF-SIMS results provided unambiguous evidence that sulfonate groups are chemically attached to the carbazole moiety of PVK. The positive SIMS spectrum of PVK was, however, little affected by the sulfonation reaction. The degree of sulfonation was quantitatively determined by XPS, Therefore, the combination of TOF-SIMS and XPS is useful to follow the sulfonation reaction, both qualitatively and quantitatively. The SIMS intensities of some characteristic fragments are linearly related to the degree of sulfonation, suggesting that quantitative analysis is possible from TOF-SIMS data.

引用

页码：4908 / 4913

页数：6

共 31 条

[1] Surface segregation in blends of polystyrene and perfluorohexane double end capped polystyrene studied by static SIMS, ISS, and XPS [J].