Characterisation of carbon nano-onions using Raman spectroscopy

被引:249
作者
Roy, D
Chhowalla, M
Wang, H
Sano, N
Alexandrou, I
Clyne, TW
Amaratunga, GAJ
机构
[1] Rutgers State Univ, Piscataway, NJ 08854 USA
[2] Univ Cambridge, Dept Mat Sci, Cambridge CB2 3QZ, England
[3] Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England
关键词
D O I
10.1016/S0009-2614(03)00523-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Characteristics of the Raman spectrum from carbon onions have been identified in terms of the position of the G peak and appearance of the transverse optic phonon peaks. Five new peaks were observed in the low wavenumber region, at about 1100, 861, 700, 450 and 250 cm(-1). The origins of these peaks are discussed in terms of the phonon density of states (PDOS) and phonon dispersion curves of graphite. The curvature of the graphene planes is invoked to explain the relaxation of the Raman selection rules and the appearance of the new peaks. The Raman spectrum of carbon onions is compared with that of highly oriented pyrolytic graphite (HOPG). The strain of graphene planes due to curvature has been estimated analytically and is used to account for the downward shift of the G peak. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:52 / 56
页数:5
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