Creation of multiple nanodots by single ions

被引:116
作者
Akcoeltekin, Ender
Peters, Thorsten
Meyer, Ralf
Duvenbeck, Andreas
Klusmann, Miriam
Monnet, Isabelle
Lebius, Henning
Schleberger, Marika [1 ]
机构
[1] Univ Duisburg Essen, FB Phys, D-47048 Duisburg, Germany
[2] CIRIL, CEA, CNRS, ENSICAEN, F-14070 Caen 5, France
关键词
D O I
10.1038/nnano.2007.109
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In the search to develop tools that are able to modify surfaces on the nanometre scale, the use of heavy ions with energies of several tens of MeV is becoming more attractive. Low-energy ions are mostly stopped by nuclei, which causes the energy to be dissipated over a large volume. In the high-energy regime, however, the ions are stopped by electronic excitations(1-3), and the extremely local (similar to 10 nm(3)) nature of the energy deposition leads to the creation of nanosized 'hillocks' or nanodots under normal incidence(4-6). Usually, each nanodot results from the impact of a single ion, and the dots are randomly distributed. Here we demonstrate that multiple, equally spaced dots, each separated by a few tens of nanometres, can be created if a single high-energy xenon ion strikes the surface at a grazing angle. By varying this angle, the number of dots, as well as their spacing, can be controlled.
引用
收藏
页码:290 / 294
页数:5
相关论文
共 32 条
[1]   Surface patterning of SrTiO3 by 30 keV ion irradiation [J].
Albrecht, J ;
Leonhardt, S ;
Spolenak, R ;
Täffner, U ;
Habermeier, HU ;
Schütz, G .
SURFACE SCIENCE, 2003, 547 (1-2) :L847-L852
[2]  
Bethe H, 1930, ANN PHYS-BERLIN, V5, P325
[3]  
Bloch F, 1933, ANN PHYS-BERLIN, V16, P285
[4]   STM AND AFM OBSERVATIONS OF LATENT TRACKS [J].
BOUFFARD, S ;
COUSTY, J ;
PENNEC, Y ;
THIBAUDAU, F .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1993, 126 (1-4) :225-228
[5]   Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBa2Cu3O7-δ thin films -: art. no. 174508 [J].
Brück, S ;
Albrecht, J .
PHYSICAL REVIEW B, 2005, 71 (17)
[6]   Discontinuous ion tracks on silicon oxide on silicon surfaces after grazing-angle heavy ion irradiation [J].
Carvalho, A. M. J. F. ;
Marinoni, M. ;
Touboul, A. D. ;
Guasch, C. ;
Lebius, H. ;
Ramonda, M. ;
Bonnet, J. ;
Saigne, F. .
APPLIED PHYSICS LETTERS, 2007, 90 (07)
[7]   ION EXPLOSION SPIKE MECHANISM FOR FORMATION OF CHARGED-PARTICLE TRACKS IN SOLIDS [J].
FLEISCHE.RL ;
PRICE, PB ;
WALKER, RM .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) :3645-+
[8]   The interface between silicon and a high-k oxide [J].
Först, CJ ;
Ashman, CR ;
Schwarz, K ;
Blöchl, PE .
NATURE, 2004, 427 (6969) :53-56
[9]   Ab initio pseudopotentials for electronic structure calculations of poly-atomic systems using density-functional theory [J].
Fuchs, M ;
Scheffler, M .
COMPUTER PHYSICS COMMUNICATIONS, 1999, 119 (01) :67-98
[10]   WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].
Horcas, I. ;
Fernandez, R. ;
Gomez-Rodriguez, J. M. ;
Colchero, J. ;
Gomez-Herrero, J. ;
Baro, A. M. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)