Growth of high-quality single crystal of 30 at% Yb:YAG and its laser performance

被引:42
作者
Yang, PZ [1 ]
Deng, PZ
Xu, J
Yin, ZW
机构
[1] Chinese Acad Sci, Shanghai Inst Ceram, Lab Funct Inorgan Mat, Shanghai 200050, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
基金
中国国家自然科学基金;
关键词
30at% Yb : YAG; crystal growth; Czochralski (CZ) method; defects; laser performance;
D O I
10.1016/S0022-0248(00)00418-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The Czochralski crystal growth of 30 at% Yb:YAG was reported. The growth parameters and annealing conditions were studied and the defects in Yb:YAG crystal were also investigated. The uniformity of 30at% Yb:YAG was characterized using the absorption coefficient of Yb:YAG at 940 nm, and the laser performance of 30 at% Yb:YAG thin chip was demonstrated as well. The results show that Yb:YAG crystals with high doping level are potential candidates for compact, efficient thin chip lasers. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:348 / 351
页数:4
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