Fabrication and ferroelectric properties of highly dense lead-free piezoelectric (K0.5Na0.5)NbO3 thick films by aerosol deposition

被引:133
作者
Ryu, Jungho [1 ]
Choi, Jong-Jin [1 ]
Hahn, Byung-Dong [1 ]
Park, Dong-Soo [1 ]
Yoon, Woon-Ha [1 ]
Kim, Ki-Hoon [1 ]
机构
[1] Korea Inst Machinery & Mat, Dept Future Technol, Chang Won 641831, Kyungnam, South Korea
关键词
D O I
10.1063/1.2720751
中图分类号
O59 [应用物理学];
学科分类号
摘要
Lead-free piezoelectric thick films of (K0.5Na0.5)NbO3 were fabricated by aerosol-deposition method. The thickness of KNN film was 7.1 mu m and fully dense films were obtained. The dielectric constants epsilon(T)(3)/epsilon(0) of the as-deposited and annealed films at 1 kHz were 116 and 545, respectively, which are higher than any previously reported values for lead-free piezoelectric thin/thick films, either without or with heat treatment. The ferroelectric properties were improved after annealing and the maximum values of P-r=8.1 mu C/cm(3) and E-c=100 kV/cm were achieved. These values are markedly superior to those of sintered KNN ceramic counterparts. (c) 2007 American Institute of Physics.
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共 16 条
[1]   Microstructure and electrical properties of lead zirconate titanate (Pb(Zr52/Ti48)O3) thick films deposited by aerosol deposition method [J].
Akedo, J ;
Lebedev, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (9B) :5397-5401
[2]   Aerosol deposition of ceramic thick films at room temperature: Densification mechanism of ceramic layers [J].
Akedo, Jun .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2006, 89 (06) :1834-1839
[3]  
Cho CR, 1999, APPL PHYS LETT, V75, P268, DOI 10.1063/1.124344
[4]   Na0.5K0.5NbO3 thin films for voltage controlled acoustoelectric device applications [J].
Cho, CR ;
Katardjiev, I ;
Grishin, M ;
Grishin, A .
APPLIED PHYSICS LETTERS, 2002, 80 (17) :3171-3173
[5]   c-axis oriented (Na,K)NbO3 thin films on Si substrates using metalorganic chemical vapor deposition [J].
Cho, CR .
MATERIALS LETTERS, 2002, 57 (04) :781-786
[6]   Electroceramic thick film fabrication for MEMS [J].
Dorey, RA ;
Whatmore, RW .
JOURNAL OF ELECTROCERAMICS, 2004, 12 (1-2) :19-32
[7]   Enhanced ferroelectric properties of Pb(Zr,Ti)O3 films by inducing permanent compressive stress - art. no. 072908 [J].
Lee, JW ;
Park, GT ;
Park, CS ;
Kim, HE .
APPLIED PHYSICS LETTERS, 2006, 88 (07)
[8]   Lead free piezoelectric materials [J].
Maeder, MD ;
Damjanovic, D ;
Setter, N .
JOURNAL OF ELECTROCERAMICS, 2004, 13 (1-3) :385-392
[9]   Fabrication and evaluation of lead-free piezoelectric ceramic LF4 thick film deposited by aerosol deposition method [J].
Oh, Se-Woong ;
Akedo, Jun ;
Park, Jae-Hyuk ;
Kawakami, Yoshihiro .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (9B) :7465-7470
[10]  
RYU JC, UNPUB