Bilayer, nanoimprint lithography

被引:27
作者
Faircloth, B [1 ]
Rohrs, H
Tiberio, R
Ruoff, R
Krchnavek, RR
机构
[1] Nuvonyx Inc, Bridgeton, MO 63044 USA
[2] Washington Univ, St Louis, MO 63130 USA
[3] Cornell Univ, Ithaca, NY 14853 USA
[4] Rowan Univ, Glassboro, NJ 08028 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 04期
关键词
D O I
10.1116/1.1305272
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanoimprint lithography has been shown to be a viable means of patterning polymer films in the sub-100 nm range. In this work, we demonstrate the use of a bilayer resist to facilitate the metal liftoff step in imprinter fabrication. The bilayer resist technology exhibits more uniform patterns and fewer missing features than similar metal nanoparticle arrays fabricated with single layer resist. The bilayer resist relies upon the differential solubility between poly(methyl methacrylate) and poly(methyl methacrylate methacrylic acid copolymer). Evidence is presented that shows the technique has a resolution of better than 10 nm. (C) 2000 American Vacuum Society. [S0734-211X(00)03103-8].
引用
收藏
页码:1866 / 1873
页数:8
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