Error analysis of 3D shape construction from structured lighting

被引：22

作者：

Yang, ZM

Wang, YF

机构：

[1] Department of Computer Science, University of California, Santa Barbara

[2] Johnson and Johnson's LifeScan Div., Milpitas, CA

[3] Department of Computer Science, University of California, Santa Barbara, CA

来源：

PATTERN RECOGNITION | 1996年 / 29卷 / 02期

基金：

美国国家科学基金会;

关键词：

image processing; structured light; orientation; curvature; error analysis;

D O I：

10.1016/0031-3203(95)00076-3

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper, we present a detailed model and analysis of several error sources and thier effects on measuring three-dimensional (3D) surface properties using the structured lighting technique. The analysis is based on a general system configuration and identifies three types of error surces-system modeling error, image processing error and experimental error. Absolute and relative error bounds in obtaining 3D surface orientation and curvature measurements using structured lighting are derived in terms of the system parameters and likely error sources. In addition to the quantization error, other likely error sources in system modeling and experimental setup are also considered. Even though our analysis is on structured lighting, the results are readily applicable to other triangulation-based techniques such as stereopsis. Finally, our analysis focuses on error in inferring surface orientation and principal surface curvature. Such analyses, to our knowledge, have never been attempted before.

引用

页码：189 / 206

页数：18

共 30 条

[11]

FROBIN W, 1982, PHOTOGRAMM ENG REM S, V48, P67

[12]

Le Moigne J., 1984, Seventh International Conference on Pattern Recognition (Cat. No. 84CH2046-1), P203

[13] ERROR MODELING IN STEREO NAVIGATION [J].

MATTHIES, L ;

SHAFER, SA .

IEEE JOURNAL OF ROBOTICS AND AUTOMATION, 1987, 3 (03) :239-248

[14] SOME ACCURACY AND RESOLUTION ASPECTS OF COMPUTER VISION DISTANCE MEASUREMENTS [J].

MCVEY, ES ;

LEE, JW .

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1982, 4 (06) :646-649

[15]

PHILLIPS GM, 1973, THEORY APPLICATIONS

[16] SURFACE MEASUREMENT BY SPACE-ENCODED PROJECTED BEAM SYSTEMS [J].

POSDAMER, JL ;

ALTSCHULER, MD .

COMPUTER GRAPHICS AND IMAGE PROCESSING, 1982, 18 (01) :1-17

[17]

POTMESIL M, 1979, P WORKSH REPR 3 DIM, pH1

[18]

PRESTON GC, 1971, MODERN ANAL GEOMETRY

[19]

RODRIGUEZ JJ, 1988, IEEE P CVPR ANN ARB, P153

[20]

SAGAN H, 1974, ADV CALCULUS

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