Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

被引：30

作者：

Martinelli, M ^{[1
]}

Bian, S ^{[1
]}

Leite, JR ^{[1
]}

Horowicz, RJ ^{[1
]}

机构：

[1] Univ Sao Paulo, Inst Fis, BR-01498 Sao Paulo, Brazil

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 12期

关键词：

D O I：

10.1063/1.120584

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivity. In this technique the reflection from a polarized Gaussian laser beam close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optical crystal, and higher values are possible to be obtained. (C) 1998 American Institute of Physics.

引用

页码：1427 / 1429

页数：3

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