Argument for a direct realization of the quantum metrological triangle

被引:90
作者
Piquemal, F [1 ]
Genevès, G [1 ]
机构
[1] Bur Natl Metrol, Lab Cent Ind Elect, F-92260 Fontenay Aux Roses, France
关键词
D O I
10.1088/0026-1394/37/3/4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The quantum metrological triangle experiment, which is under development at the Bureau National de Metrologie-Laboratoire Central des industries Electriques (BNM-LCIE), consists of applying Ohm's law directly to the quantities related to the single-electron tunnelling (SET) effect, the ac Josephson effect (JE) and the quantum Hall effect (QHE). The goal of this experiment is to test, at a significant level of uncertainty of about 1 part in 10(8), the coherence of the constants involved in these three quantum phenomena: the Josephson constant K-J, expected to correspond to the ratio 2e/h (where e is the elementary charge and h the Planck constant); the von Klitzing constant R-K, in relation to the quantum resistance h/e(2); and a new constant Q(x), defined here as the estimate of e. Moreover, realization of the metrological triangle experiment, combined with the experiment being developed at the NIST aimed at charging a capacitor by means of a SET pump, will give information liable to be taken into account in future adjustments of the fundamental constants without requiring any hypothesis regarding the physical phenomena involved. The combination of these two experiments should yield a new value of R-K in ohms of the International System of Units (SI). The broad outlines of our experimental set-up are given, along with the expected uncertainties in both the short and long terms.
引用
收藏
页码:207 / 211
页数:5
相关论文
共 41 条
[1]  
AVERIN DV, 1991, NATO ASI SER B-PHYS, V294, P311
[2]  
*BIPM, 1988, BIPM COM CONS EL, V18, pE15
[3]  
*BIPM, 1988, BIPM P VERB COM INT, V56
[4]  
*BIPM, 1988, BIPM COM CONS EL, V18, pE65
[5]   JOSEPHSON EFFECT IN A SUPERCONDUCTING RING [J].
BLOCH, F .
PHYSICAL REVIEW B, 1970, 2 (01) :109-&
[6]   Programmable 1 V DC voltage standard [J].
Burroughs, CJ ;
Benz, SP ;
Hamilton, CA ;
Harvey, TE .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (02) :279-281
[7]   Comparison of quantum Hall effect resistance standards of the PTB and the BIPM [J].
Delahaye, F ;
Witt, TJ ;
Pesel, E ;
Schumacher, B ;
Warnecke, P .
METROLOGIA, 1997, 34 (03) :211-214
[8]   COMPARISON OF QUANTUM HALL-EFFECT RESISTANCE STANDARDS OF THE BNM/LCIE AND THE BIPM [J].
DELAHAYE, F ;
WITT, TJ ;
PIQUEMAL, F ;
GENEVES, G .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :258-261
[9]  
DELAHAYE F, 1995, METROLOGIA, V32, P385
[10]   SINGLE-ELECTRON TRANSFER IN METALLIC NANOSTRUCTURES [J].
DEVORET, MH ;
ESTEVE, D ;
URBINA, C .
NATURE, 1992, 360 (6404) :547-553