Highly stable fiber Bragg gratings written in hydrogen-loaded fiber

被引:30
作者
Guan, BO [1 ]
Tam, HY
Tao, XM
Dong, XY
机构
[1] Hong Kong Polytech Univ, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China
[2] Hong Kong Polytech Univ, Inst Text & Clothing, Hong Kong, Hong Kong, Peoples R China
[3] Nankai Univ, Inst Modern Opt, Tianjin 300071, Peoples R China
关键词
fabrication; fibre Bragg gratings; photosensitivity; thermal stability;
D O I
10.1109/68.883826
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrated that the thermal stability of fiber Bragg gratings written in hydrogen-loaded standard fibers can be significantly enhanced by preirradiating the fiber with UV beam before writing gratings. Our experimental result shows that these gratings maintained more than 60% of their initial index modulation after 10 hours at 605 degreesC.
引用
收藏
页码:1349 / 1351
页数:3
相关论文
共 8 条
[1]   PRODUCTION OF IN-FIBER GRATINGS USING A DIFFRACTIVE OPTICAL-ELEMENT [J].
ANDERSON, DZ ;
MIZRAHI, V ;
ERDOGAN, T ;
WHITE, AE .
ELECTRONICS LETTERS, 1993, 29 (06) :566-568
[2]   Thermal decay of fiber Bragg gratings of positive and negative index changes formed at 193 nm in a boron-codoped germanosilicate fiber [J].
Dong, L ;
Liu, WF .
APPLIED OPTICS, 1997, 36 (31) :8222-8226
[3]   DECAY OF ULTRAVIOLET-INDUCED FIBER BRAGG GRATINGS [J].
ERDOGAN, T ;
MIZRAHI, V ;
LEMAIRE, PJ ;
MONROE, D .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (01) :73-80
[4]  
FOKINE MA, 1997, P C BRAGG GRAT PHOT, P58
[5]   Thermal stability analysis of UV-induced fiber Bragg gratings [J].
Kannan, S ;
Guo, JZY ;
Lemaire, PJ .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1997, 15 (08) :1478-1483
[6]  
KOHNKE GE, 1999, P OPT FIB COMM C INT
[7]   ANNEALING OF BRAGG GRATINGS IN HYDROGEN-LOADED OPTICAL-FIBER [J].
PATRICK, H ;
GILBERT, SL ;
LIDGARD, A ;
GALLAGHER, MD .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (05) :2940-2945
[8]   Growth of strength of Bragg gratings written in H2 loaded telecommunication fibre during CW UV post-exposure [J].
Ramecourt, D ;
Niay, P ;
Bernage, P ;
Riant, I ;
Douay, M .
ELECTRONICS LETTERS, 1999, 35 (04) :329-331