Effect of Ag addition on the structures of intermetallic compounds and the adhesion strength of the Sn-9Zn-xAg/Cu interface

被引:12
作者
Chang, TC
Wang, MC
Hon, MH
机构
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan
[2] Natl Kaohsiung Univ Appl Sci, Dept Mech Engn, Kaohsiung 80782, Taiwan
关键词
interfaces; scanning electron microscopy; transmission electron microscopy; X-ray diffraction; alloys; intermetallic compounds;
D O I
10.1016/S0022-0248(02)02479-X
中图分类号
O7 [晶体学];
学科分类号
0702 [物理学]; 070205 [凝聚态物理]; 0703 [化学]; 080501 [材料物理与化学];
摘要
The effect of Ag addition on the structures of the intermetallic compounds (IMCs) and the adhesion strength of the Sn-9Zn-xAg solder alloy/Cu interface has been investigated by X-ray diffraction, scanning electron microscopy, energy dispersive spectrometry, transmission electron microscopy and electron diffraction. The XRD patterns show that the eta-Cu6Sn5, eta'-Cu6Sn5 and Cu5Zn8 are found at the Sn-9Zn-xAg/Cu interface. The Ag3Sn formed at the interface when Ag addition is above 2.5 wt%. Monoclinic and hexagonal Cu6Sn5 intermetallic compounds (IMCs) are formed at the interface close to the solder alloy. A high-resolution lattice image also shows the same result and the bi-structural Cu6Sn5 grows as a twin-like crystallite along the boundaries. The adhesion strength has an opposite relationship to the crystallite size of the Cu6Sn5 layer. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:391 / 400
页数:10
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