Ultrasmooth V-grooves in InP by two-step wet chemical etching

被引:26
作者
Bonsch, P [1 ]
Wullner, D
Schrimpf, T
Schlachetzki, A
Lacmann, R
机构
[1] Tech Univ Braunschweig, Inst Halbleitertech, D-38106 Braunschweig, Germany
[2] Tech Univ Braunschweig, Inst Theoret & Phys Chem, D-38106 Braunschweig, Germany
关键词
D O I
10.1149/1.1838450
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A two-step wet chemical etching process using HBr and HBr:K2Cr2O7 was developed in order to fabricate high-quality V-grooves in InP (100) wafers. A 40 nm titanium film, which was patterned by conventional photolithography and liftoff, was used as the etching mask. The {111}A sidewalls are mirrorlike with an arithmetic average roughness of less than 0.4 nm. The tip radius of the V-grooves is approximately 7 nm. Both values were determined by atomic force microscopy.
引用
收藏
页码:1273 / 1276
页数:4
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