Identifying defects in nanoscale materials

被引：71

作者：

Ishigami, M

Choi, HJ

Aloni, S

Louie, SG

Cohen, ML

Zettl, A ^{[1
]}

机构：

[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

[3] Korea Inst Adv Study, Seoul 130722, South Korea

来源：

PHYSICAL REVIEW LETTERS | 2004年 / 93卷 / 19期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevLett.93.196803

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have developed a novel iterative experimental-theoretical technique which can identify the atomic structure of defects in many-atom nanoscale materials from scanning tunneling microscopy and spectroscopy data. A given model for a defect structure is iteratively improved until calculated microscopy and spectroscopy data based on the model converge on the experimental results. We use the technique to identify a defect responsible for the electronic properties of a carbon nanotube intramolecular junction. Our technique can be extended for analysis of defect structures in nanoscale materials in general.

引用

页码：196803 / 1

页数：4

共 37 条

[11] How do gold nanowires break? [J].