Equal optical path beamsplitter for a pencil beam interferometer and shearing interferometer

被引:13
作者
Qian, SN [1 ]
Takacs, PZ [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
equal optical path; beamsplitter; pencil beam interferometer; long trace profiler; shearing;
D O I
10.1117/1.1555733
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
To produce stable beams used by pencil beam interferometers, a new equal optical path beamsplitter (EBS) is developed. The beamsplitter divides one incident pencil beam into two parallel exiting beams with a fixed separation. The new EBS is a monolithic unit comE-mail: prised of two right-angle trapezoidal prisms with a thin film beamsplitting coating on the faces, which are cemented together. Adjusting the dimensions of each element according to a simple algebraic relation produces two identical, parallel beams separated by a fixed distance with a zero optical path difference between them. The monolithic EBS is very simple and stable. It has applications in interferometers that require the use of a pencil beam source, such as the long trace profiler (LTP) and the precise angle monitor. If a large-diameter wavefront is incident on the EBS, it can be used in shearing interferometer applications, such as the lateral translation shearing interferometer and the rotational shearing interferometer. Use of the EBS in all of these configurations significantly improves instrument stability and accuracy. Some application examples and test results are presented. (C) 2003 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:929 / 934
页数:6
相关论文
共 12 条
[1]   Design of an optical probe for surface profile measurement [J].
Huang, PS ;
Xu, XR .
OPTICAL ENGINEERING, 1999, 38 (07) :1223-1228
[2]   Sub-μrad angular stability measurements by use of Long-Trace-Profiler-based systems [J].
Qian, SN ;
Takacs, P .
X-RAY OPTICS DESIGN, PERFORMANCE, AND APPLICATIONS, 1999, 3773 :158-166
[3]  
Qian SN, 2000, P SOC PHOTO-OPT INS, V4101, P263
[4]   Portable long trace profiler: Concept and solution [J].
Qian, SN ;
Takacs, P ;
Sostero, G ;
Cocco, D .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (08) :3198-3204
[5]  
QIAN SN, 2001, DISCLOSURE US PATENT
[6]   A SIMPLE INEXPENSIVE WAVE FRONT SHEARING INTERFEROMETER [J].
SAUNDERS, JB .
APPLIED OPTICS, 1967, 6 (09) :1581-&
[7]   COMPACT IN-LINE LASER RADIAL SHEAR INTERFEROMETER [J].
SHUKLA, RP ;
MOGHBEL, M ;
VENKATESWARLU, P .
APPLIED OPTICS, 1992, 31 (21) :4125-4131
[8]  
TAKACS P, 1989, Patent No. 4884697
[9]  
Takacs P. Z., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V749, P59, DOI 10.1117/12.939842
[10]   Improvements in the accuracy and the repeatability of long trace profiler measurements [J].
Takacs, PZ ;
Church, EL ;
Bresloff, CJ ;
Assoufid, L .
APPLIED OPTICS, 1999, 38 (25) :5468-5479