Comparison of TiN, ZrN and CrN hard nitride coatings: Electrochemical and thermal oxidation

被引:297
作者
Milosev, I [1 ]
Strehblow, HH [1 ]
Navinsek, B [1 ]
机构
[1] UNIV DUSSELDORF,INST PHYS CHEM & ELECTROCHEM,D-40225 DUSSELDORF,GERMANY
关键词
hard coatings; valence band; nitrides; physical vapour deposition (PVD); x-ray photoelectron spectroscopy (XPS);
D O I
10.1016/S0040-6090(97)00069-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Although TiN has hitherto been the most extensively investigated hard coating, other binary and ternary nitrides are the subject of ever-increasing interest. In this work the behaviour of TiN. ZrN and CrN coatings is compared. concentrating on the mechanism of their oxidation. The sequence of the processes included in the electrochemical and thermal oxidation was followed by X-ray photoelectron spectroscopy (XPS). It is shown that the behaviour of TiN and ZrN coatings is qualitatively similar. whereas CrN exhibits a quite different behaviour. Valence band spectra of these nitrides and their related oxides are presented and discussed. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:246 / 254
页数:9
相关论文
共 46 条
[1]   NATURE OF THE PASSIVE FILM ON FE-CR ALLOYS AS STUDIED BY O-18 SECONDARY ION MASS-SPECTROMETRY - REDUCTION OF THE PRIOR FILM AND STABILITY TO EXSITU SURFACE-ANALYSIS [J].
BARDWELL, JA ;
SPROULE, GI ;
MITCHELL, DF ;
MACDOUGALL, B ;
GRAHAM, MJ .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS, 1991, 87 (07) :1011-1019
[2]   INSITU XANES DETECTION OF CR(VI) IN THE PASSIVE FILM ON FE-26CR [J].
BARDWELL, JA ;
SPROULE, GI ;
MACDOUGALL, B ;
GRAHAM, MJ ;
DAVENPORT, AJ ;
ISAACS, HS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (02) :371-373
[3]  
BRIGGS D, 1983, PRACTICAL SURFACE AN
[4]   ON THE ROLE OF CR IN THE PASSIVITY OF STAINLESS-STEEL [J].
BROOKS, AR ;
CLAYTON, CR ;
DOSS, K ;
LU, YC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (12) :2459-2464
[5]   EFFECT OF COMPOSITION AND THICKNESS ON CORROSION BEHAVIOR OF TIN AND ZRN THIN-FILMS [J].
BROWN, R ;
ALIAS, MN ;
FONTANA, R .
SURFACE & COATINGS TECHNOLOGY, 1993, 62 (1-3) :467-473
[6]   BAND-STRUCTURE OF TRANSITION-METAL COMPOUNDS [J].
CALAIS, JL .
ADVANCES IN PHYSICS, 1977, 26 (06) :847-885
[7]   LOW-TEMPERATURE OXIDATION BEHAVIOR OF REACTIVELY SPUTTERED TIN BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND CONTACT RESISTANCE MEASUREMENTS [J].
ERNSBERGER, C ;
NICKERSON, J ;
SMITH, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2784-2788
[8]   CHARACTERIZATION AND OPTICAL-PROPERTIES OF THIN-FILMS FORMED ON TIN COATINGS DURING ELECTROCHEMICAL TREATMENTS [J].
FRANCOIS, JC ;
MASSIANI, Y ;
GRAVIER, P ;
GRIMBLOT, J ;
GENGEMBRE, L .
THIN SOLID FILMS, 1993, 223 (02) :223-229
[9]   SEMICONDUCTOR ELECTRODES .10. PHOTOELECTROCHEMICAL BEHAVIOR OF SEVERAL POLYCRYSTALLINE METAL-OXIDE ELECTRODES IN AQUEOUS-SOLUTIONS [J].
HARDEE, KL ;
BARD, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (02) :215-224
[10]   THE FORMATION OF THE PASSIVE LAYER ON CR IN 0.5-M H2SO4 - A COMBINED ELECTROCHEMICAL AND SURFACE ANALYTICAL STUDY [J].
HAUPT, S ;
STREHBLOW, HH .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1987, 228 (1-2) :365-392