Nanometer-scale measurements of Fe3+/ΣFe by electron energy-loss spectroscopy:: A cautionary note

被引:43
作者
Garvie, LAJ
Zega, TJ
Rez, P
Buseck, PR
机构
[1] Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA
[2] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
关键词
D O I
10.2138/am-2004-11-1204
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
The effects of electron-beam damage on the Fe3+/SigmaFe (total iron) ratio were measured by electron energy-loss spectroscopy (EELS) with a transmission electron microscope (TEM). Spectra were acquired from crushed and ion-beam-thinned cronstedfite. For fluences below 1 x 10(4) e/Angstrom(2), the Fe3+/SigmaFe values from crushed grains range between 0.43 and 0.49, consistent with undamaged material. These measurements were acquired from flakes 180 to 1000 A thick. With increase in fluence, samples <400 A thick become damaged and exhibit Fe3+/SigmaFe values >0.5. The critical fluence for radiation damage by 100 kV electrons as defined by Fe3+/SigmaFe <0.5 for cronstedfite at 300 K, is I X 101 e/Angstrom(2). The absorbed dose to the speciman during acquisition of a typical EELS spectrum is large, with values around 2.2 x 10(10) Gy (J/kg), equivalent to the deposition of 620 eV/Angstrom(3). Cooling to liquid N, temperature did not significantly slow the damage process. Ion-beam thinning produces an amorphous layer on crystal surfaces. Spectra from the thinnest regions, which are amorphous, exhibit Fe3+/SigmaFe >0.7. With increase in sample thickness, the Fe3+/SigmaFe values decrease to a minimum, consistent with data from the undamaged material. The increase of Fe3+/SigmaFe with respect to electron-beam irradiation is likely caused by loss of H. At low fluences, the loss of H is negligible, thus allowing consistent Fe3+/SigmaFe values to be measured. The cronstedfite study illustrates the care required when using EELS to measure Fe3+/SigmaFe values. Similar damage effects occur for a range of high-valence and mixed-oxidation state metals in minerals. EELS is the only spectroscopic method that can be used routinely to determine mixed-valence ratios at the nanometer scale, but care is required when measuring these data. Consideration needs to be given to the incident beam current, fluence, fluence rate, and sample thickness.
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页码:1610 / 1616
页数:7
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