Mobile ionic impurities in organic semiconductors

被引:87
作者
Rep, DBA
Morpurgo, AF
Sloof, WG
Klapwijk, TM
机构
[1] Delft Univ Technol, Dept Nanosci, Fac Sci Appl, NL-2628 CJ Delft, Netherlands
[2] Delft Univ Technol, Mat Sci Lab, Fac Sci Appl, NL-2628 AL Delft, Netherlands
关键词
D O I
10.1063/1.1538338
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the stability in time of the current-voltage characteristics of organic thin-film devices on glass substrates. We find for poly(3-hexylthiophene) and for pentacene that the resistance of the devices gradually changes under the application of an electrical bias depending on the sodium content of the glass substrates used in the experiment. For devices on a very common type of glass (with a Na2O content of about 6%) and on sodalime glass (14% Na2O) substrates, the prolonged application of a voltage bias results in a substantial decrease (up to two orders of magnitude) of the bulk and contact resistances, whereas for sodium-free glass substrates the gradual changes in current-voltage characteristics are much smaller. A systematic study of the electrical behavior complemented by chemical analysis shows that the instabilities observed are due to Na+ ions diffusing from the substrate into the organic film, and moving inside the organic material as a result of the applied electric field. Our results show in detail how ion motion in organic materials results in substantial hysteresis and device instabilities. (C) 2003 American Institute of Physics.
引用
收藏
页码:2082 / 2090
页数:9
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