High-resolution x-ray scattering measurements: I. Surfaces

被引：78

作者：

Daillant, J

Alba, M

机构：

[1] Ctr Univ Paris Sud, LURE, F-91898 Orsay, France

[2] CEA Saclay, Serv Phys Etat Condense, F-91191 Gif Sur Yvette, France

来源：

REPORTS ON PROGRESS IN PHYSICS | 2000年 / 63卷 / 10期

关键词：

D O I：

10.1088/0034-4885/63/10/203

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquid-vapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.

引用

页码：1725 / 1777

页数：53

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[1] Charged polymer brushes: Counterion incorporation and scaling relations [J].